The Cambridge Stereoscan scanning electron microscope that we use allows us to not only magnify a sample over 200,000 times to inspect the surface, but coupled with the EDAX capability within the SEM we can determine what the surface composition is. By viewing a cross section we can generate a histogram of the coating from the surface all the way down to the base material, observing the intermetallic atomic bonds that have been formed. Our sputtering capabilities also enable us to coat materials for conductivity purposes for specialized SEM viewing. A cold finger attachment enables us to view various phase changes as a function of temperature if necessary.

But we are not limited to viewing by electrons only. Our Olympus Vanox research metallurgical microscopeprovides a look at specimens optically. Optical thickness measurements can be taken by viewing cross sections with the calibrated filar. By using attachments such as the adjustable excitation band and transmitted light wavelength attachment, the transmitted light phase - contrast attachment, as well as Nomarski prisms in conjunction with various polarizing filters, provides us the opportunity to observe stresses in the various coatings that are applied.

Certainly an area not to be neglected is that of chemistry control of the baths themselves. This is accomplished by the use of an Instrumentation Laboratory Atomic Absorption Spectrophotometer. Solution constituents can be measured down to parts per billion. By having the ability to constantly monitor the chemistry of each bath, we can control not only potential contaminants, but we can also maintain proper bath valance, a very important issue when it comes to the direction and the grain size of deposited metals.

Nondestructive measurements are generated from an Oxford Instruments CMI X-ray fluorescence measurement system. The unit has the capability to measure metal coating thickness as well as the composition of numerous layers of different metals plus alloy coating compositions.